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http://dx.doi.org/10.1002/anie.199703611DOI: 10.1002/anie.199703611
Novel Cleft-Containing Porphyrins as Models for Studying Electron Transfer Processes
Authors: Dr. Joost N. H. Reek, Dr. Alan E. Rowan, Dr. René de Gelder, Prof. Dr. Paul T. Beurskens, Prof. Dr. Maxwell J. Crossley, Steven De Feyter, Prof. Dr. Frans de Schryver, Prof. Dr. Roeland J. M. Nolte
Angewandte Chemie International Edition in English V.36 Issue 4, Pages 361 - 363
