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[Neptunyi]

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1. Webb, P. C., Potts, P. J., Watson, J. S.,
Versatile method. for analysis of oxide ore samples by energy dispersive. X-ray fluorescence /J. Anal. At. Spectrom., 1990, 5, 361R - 378R,

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http://dx.doi.org/10.1039/JA990050361R

2. Laura E. Giblin, William H. Blackburn, and David M. Jenkins
X-ray continuum discrimination technique for the energy-dispersive analysis of fine particles/ Anal. Chem.; 1993; 65(24) pp 3576 - 3580;

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http://dx.doi.org/10.1021/ac00072a008

3. P. Y. Hung, C. Gondran, A. Ghatak-Roy, S. Terada, B. Bunday, H. Yeung and A. Diebold
X-ray reflectometry and x-ray fluorescence monitoring of the atomic layer deposition process for high-k gate dielectrics/Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures -- September 2005 -- Volume 23, Issue 5, pp. 2244-2248

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http://dx.doi.org/10.1116/1.2009774

4. L. Eisgruber, B. Joshi, N. Gomez, J. Britt and T. Vincent
In situ X-ray fluorescence used for real-time control of CuInxGa1-xSe2 thin film composition/Thin Solid Films, 2002, 408(1–2), 64

5. А.Eslava-Gomez and S. J. Parry
Dual attenuation of X-rays for measurement of the concentration of metals in solution/ Analyst, 2002, 127, 847–851

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http://dx.doi.org/10.1039/b200257b

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[N oxide]

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http://dx.doi.org/10.1039/JA990050361R

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[Neptunyi]

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