1. Using a square-wave signal for fault diagnosis of analog parts of mixed-signal embedded systems controlled by microcontrollers
Czaja, Z.
Gdansk Univ. of Technol., Gdansk
Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE
Issue Date: 1-3 May 2007
On page(s): 1 – 6
- DOI:
http://dx.doi.org/10.1109/IMTC.2007.379196
Lubaszewski, M.; Mir, S.; Kolarik, V.; Nielsen, C.; Courtois, B.;
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Issue Date: Apr 2000
Volume: 8 Issue:2
On page(s): 113 – 128
- DOI:
http://dx.doi.org/10.1109/92.831432
Kampik, M. Laiz, H. Klonz,
Instrumentation and Measurement, IEEE Transactions on
Issue Date: Apr 2000
Volume: 49 Issue: 2
On page(s): 429 – 433
- DOI:
http://dx.doi.org/10.1109/19.843091
Savir, J. Zhen Guo
Instrumentation and Measurement, IEEE Transactions on
Issue Date: Oct. 2003
Volume: 52 Issue: 5
On page(s): 1444 – 1454
- DOI:
http://dx.doi.org/10.1109/TIM.2003.818541
Rapisarda, L. de Carlo, R.
Circuits and Systems, IEEE Transactions on
Issue Date: Apr 1983
Volume: 30 Issue: 4
On page(s): 223 – 234
- DOI:
http://dx.doi.org/10.1109/TCS.1983.1085352
AuthorsLin, Bin-Hong
Shieh, Shao-Hui
Wu, Cheng-Wen
Proceedings of the Asian Test Symposium, 1996, p. 232-237
- DOI:
http://dx.doi.org/10.1109/ATS.1996.555164