C. S Shah1, M. J Patni and M. V Pandya2
Dielectric spectroscopy — an analytical tool for monitoring the deterioration due to high energy radiation in ethylene propylene diene terpolymer (EPDM) vulcanizates
Journal of Materials Science, Volume 32, Number 22, pp.6119-6126
Код: Выделить всё
http://dx.doi.org/10.1023/A:1018652103321