Ruey-Lin Ueng, A.C. Sahayam, Shiuh-Jen Jiang, CHIA-CHING WAN
MICROWAVE-ASSISTED VOLATILIZATION OF CHLORIDES OF GE AND SE FOR THE DETERMINATION OF TRACE IMPURITIES IN HIGH PURITY GE AND SE BY ICP-MS
Journal of Analytical Atomic Spectrometry
2004, том 19, №5 с. 681-684
Код: Выделить всё
http://dx.doi.org/10.1039/b400225n
